Run the Clamp Double-Pulse Test

Before you run Double-Pulse characterization tests, you must set the Global Settings, configure the System Hardware, and Calibrate the System.

The DPT Clamp Test is the same as the Standard test but uses the Clamp Circuit on the GaN Test Module. For accurate R_DS(on) measurements the clamping circuit limits the applied voltage level to the oscilloscope probe while the DUT is turned off. This way an oscilloscope probe with a lower divider ratio (10:1) can be used for accurately measuring V_DS while the transistor is turned on.

For the Clamp DPT test, use the Clamp Circuit Module and do not install the N2819A Differential Probe. Instead, install one N2873A 10:1 Oscilloscope Probe that connects to the Clamp Test (V_CLAMP) probe socket. Do not exceed 400 Volts V_DS or V_CE.

Use these Double-Pulse Test Modules and Oscilloscope Probes

This Clamped DPT test uses the following Test Modules and Oscilloscope Probes:

10076C 100:1 High Voltage Probe for measuring V_DS on the DUT Module
PD1000-60002 Protection Probe for measuring I_D.
N2873 10:1 Standard Oscilloscope Probe for measuring V_GS on the Low-Side Gate Drive Module.
N2873 10:1 Standard Oscilloscope Probe for measuring V_DS on the Clamp Circuit Module.

The Clamp Circuit provides the following:

Clamps voltage to levels suitable for using the N2873A 10:1 passive probe
Characterized systematic errors so that they can be taken into account
Quantified achievable accuracy

The maximum V_DS or V_CE test voltage that may be applied to the Clamp Circuit is 400 V. This for both IGBT (V_CE) and FET (V_DS) devices.The maximum V_DS or V_CE test voltage that may be applied to the Clamp Circuit is 400 V. This for both IGBT (V_CE) and FET (V_DS) devices.

^a. GaN devices require a special DUT Test Board and a software license. Contact Keysight for information.

Parameter Settings

After setting the test parameters, click the Start button to start the test.